2017-08-31 13:48:30 -04:00
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/*
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* This file is part of the MicroPython project, http://micropython.org/
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*
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* The MIT License (MIT)
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*
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* Copyright (c) 2017 Dan Halbert for Adafruit Industries
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*
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* Permission is hereby granted, free of charge, to any person obtaining a copy
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* of this software and associated documentation files (the "Software"), to deal
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* in the Software without restriction, including without limitation the rights
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* to use, copy, modify, merge, publish, distribute, sublicense, and/or sell
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* copies of the Software, and to permit persons to whom the Software is
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* furnished to do so, subject to the following conditions:
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*
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* The above copyright notice and this permission notice shall be included in
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* all copies or substantial portions of the Software.
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*
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* THE SOFTWARE IS PROVIDED "AS IS", WITHOUT WARRANTY OF ANY KIND, EXPRESS OR
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* IMPLIED, INCLUDING BUT NOT LIMITED TO THE WARRANTIES OF MERCHANTABILITY,
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* FITNESS FOR A PARTICULAR PURPOSE AND NONINFRINGEMENT. IN NO EVENT SHALL THE
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* AUTHORS OR COPYRIGHT HOLDERS BE LIABLE FOR ANY CLAIM, DAMAGES OR OTHER
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* LIABILITY, WHETHER IN AN ACTION OF CONTRACT, TORT OR OTHERWISE, ARISING FROM,
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* OUT OF OR IN CONNECTION WITH THE SOFTWARE OR THE USE OR OTHER DEALINGS IN
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* THE SOFTWARE.
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*/
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/*
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* Includes code from ASF sample code adc_temp.h and adc_temp.c,
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* and so includes this license:
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*
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* Copyright (C) 2015 Atmel Corporation. All rights reserved.
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*
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* License
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*
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* Redistribution and use in source and binary forms, with or without
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* modification, are permitted provided that the following conditions are met:
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*
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* 1. Redistributions of source code must retain the above copyright notice,
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* this list of conditions and the following disclaimer.
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*
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* 2. Redistributions in binary form must reproduce the above copyright notice,
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* this list of conditions and the following disclaimer in the documentation
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* and/or other materials provided with the distribution.
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*
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* 3. The name of Atmel may not be used to endorse or promote products derived
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* from this software without specific prior written permission.
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*
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* 4. This software may only be redistributed and used in connection with an
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* Atmel microcontroller product.
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*
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* THIS SOFTWARE IS PROVIDED BY ATMEL "AS IS" AND ANY EXPRESS OR IMPLIED
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* WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF
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* MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE AND NON-INFRINGEMENT ARE
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* EXPRESSLY AND SPECIFICALLY DISCLAIMED. IN NO EVENT SHALL ATMEL BE LIABLE FOR
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* ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL
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* DAMAGES (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS
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* OR SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION)
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* HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
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* STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN
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* ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE
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* POSSIBILITY OF SUCH DAMAGE.
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*/
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2020-06-19 15:05:51 -04:00
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#include "py/mphal.h"
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2017-08-31 13:48:30 -04:00
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#include "common-hal/microcontroller/Processor.h"
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2018-06-15 19:16:21 -04:00
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#include "samd/adc.h"
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2018-04-27 21:03:42 -04:00
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2017-09-29 16:58:13 -04:00
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#include "peripheral_clk_config.h"
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2017-08-31 13:48:30 -04:00
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2018-04-27 21:03:42 -04:00
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#define ADC_TEMP_SAMPLE_LENGTH 4
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#define INT1V_VALUE_FLOAT 1.0
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#define INT1V_DIVIDER_1000 1000.0
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#define ADC_12BIT_FULL_SCALE_VALUE_FLOAT 4095.0
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2017-08-31 13:48:30 -04:00
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2019-10-12 15:42:15 -04:00
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// channel argument (ignored in calls below)
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#define IGNORED_CHANNEL 0
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2017-08-31 13:48:30 -04:00
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// Decimal to fraction conversion. (adapted from ASF sample).
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2018-04-27 21:03:42 -04:00
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STATIC float convert_dec_to_frac(uint8_t val) {
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float float_val = (float)val;
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if (val < 10) {
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return (float_val/10.0);
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} else if (val < 100) {
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return (float_val/100.0);
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} else {
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return (float_val/1000.0);
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}
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}
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// Extract the production calibration data information from NVM (adapted from ASF sample),
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// then calculate the temperature
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#ifdef SAMD21
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STATIC float calculate_temperature(uint16_t raw_value) {
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volatile uint32_t val1; /* Temperature Log Row Content first 32 bits */
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volatile uint32_t val2; /* Temperature Log Row Content another 32 bits */
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uint8_t room_temp_val_int; /* Integer part of room temperature in °C */
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uint8_t room_temp_val_dec; /* Decimal part of room temperature in °C */
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uint8_t hot_temp_val_int; /* Integer part of hot temperature in °C */
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uint8_t hot_temp_val_dec; /* Decimal part of hot temperature in °C */
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int8_t room_int1v_val; /* internal 1V reference drift at room temperature */
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int8_t hot_int1v_val; /* internal 1V reference drift at hot temperature*/
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float tempR; // Production Room temperature
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float tempH; // Production Hot temperature
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float INT1VR; // Room temp 2's complement of the internal 1V reference value
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float INT1VH; // Hot temp 2's complement of the internal 1V reference value
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uint16_t ADCR; // Production Room temperature ADC value
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uint16_t ADCH; // Production Hot temperature ADC value
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float VADCR; // Room temperature ADC voltage
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float VADCH; // Hot temperature ADC voltage
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uint32_t *temp_log_row_ptr = (uint32_t *)NVMCTRL_TEMP_LOG;
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val1 = *temp_log_row_ptr;
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temp_log_row_ptr++;
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val2 = *temp_log_row_ptr;
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room_temp_val_int = (uint8_t)((val1 & FUSES_ROOM_TEMP_VAL_INT_Msk) >> FUSES_ROOM_TEMP_VAL_INT_Pos);
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room_temp_val_dec = (uint8_t)((val1 & FUSES_ROOM_TEMP_VAL_DEC_Msk) >> FUSES_ROOM_TEMP_VAL_DEC_Pos);
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hot_temp_val_int = (uint8_t)((val1 & FUSES_HOT_TEMP_VAL_INT_Msk) >> FUSES_HOT_TEMP_VAL_INT_Pos);
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hot_temp_val_dec = (uint8_t)((val1 & FUSES_HOT_TEMP_VAL_DEC_Msk) >> FUSES_HOT_TEMP_VAL_DEC_Pos);
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room_int1v_val = (int8_t)((val1 & FUSES_ROOM_INT1V_VAL_Msk) >> FUSES_ROOM_INT1V_VAL_Pos);
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hot_int1v_val = (int8_t)((val2 & FUSES_HOT_INT1V_VAL_Msk) >> FUSES_HOT_INT1V_VAL_Pos);
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ADCR = (uint16_t)((val2 & FUSES_ROOM_ADC_VAL_Msk) >> FUSES_ROOM_ADC_VAL_Pos);
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ADCH = (uint16_t)((val2 & FUSES_HOT_ADC_VAL_Msk) >> FUSES_HOT_ADC_VAL_Pos);
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tempR = room_temp_val_int + convert_dec_to_frac(room_temp_val_dec);
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tempH = hot_temp_val_int + convert_dec_to_frac(hot_temp_val_dec);
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INT1VR = 1 - ((float)room_int1v_val/INT1V_DIVIDER_1000);
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INT1VH = 1 - ((float)hot_int1v_val/INT1V_DIVIDER_1000);
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VADCR = ((float)ADCR * INT1VR)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
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VADCH = ((float)ADCH * INT1VH)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
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float VADC; /* Voltage calculation using ADC result for Coarse Temp calculation */
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float VADCM; /* Voltage calculation using ADC result for Fine Temp calculation. */
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float INT1VM; /* Voltage calculation for reality INT1V value during the ADC conversion */
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VADC = ((float)raw_value * INT1V_VALUE_FLOAT)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
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// Hopefully compiler will remove common subepxressions here.
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// calculate fine temperature using Equation1 and Equation
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// 1b as mentioned in data sheet section "Temperature Sensor Characteristics"
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// of Electrical Characteristics. (adapted from ASF sample code).
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// Coarse Temp Calculation by assume INT1V=1V for this ADC conversion
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float coarse_temp = tempR + (((tempH - tempR)/(VADCH - VADCR)) * (VADC - VADCR));
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// Calculation to find the real INT1V value during the ADC conversion
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INT1VM = INT1VR + (((INT1VH - INT1VR) * (coarse_temp - tempR))/(tempH - tempR));
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VADCM = ((float)raw_value * INT1VM)/ADC_12BIT_FULL_SCALE_VALUE_FLOAT;
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// Fine Temp Calculation by replace INT1V=1V by INT1V = INT1Vm for ADC conversion
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float fine_temp = tempR + (((tempH - tempR)/(VADCH - VADCR)) * (VADCM - VADCR));
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return fine_temp;
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}
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#endif // SAMD21
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#ifdef SAMD51
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STATIC float calculate_temperature(uint16_t TP, uint16_t TC) {
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uint32_t TLI = (*(uint32_t *)FUSES_ROOM_TEMP_VAL_INT_ADDR & FUSES_ROOM_TEMP_VAL_INT_Msk) >> FUSES_ROOM_TEMP_VAL_INT_Pos;
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uint32_t TLD = (*(uint32_t *)FUSES_ROOM_TEMP_VAL_DEC_ADDR & FUSES_ROOM_TEMP_VAL_DEC_Msk) >> FUSES_ROOM_TEMP_VAL_DEC_Pos;
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float TL = TLI + convert_dec_to_frac(TLD);
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uint32_t THI = (*(uint32_t *)FUSES_HOT_TEMP_VAL_INT_ADDR & FUSES_HOT_TEMP_VAL_INT_Msk) >> FUSES_HOT_TEMP_VAL_INT_Pos;
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uint32_t THD = (*(uint32_t *)FUSES_HOT_TEMP_VAL_DEC_ADDR & FUSES_HOT_TEMP_VAL_DEC_Msk) >> FUSES_HOT_TEMP_VAL_DEC_Pos;
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float TH = THI + convert_dec_to_frac(THD);
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uint16_t VPL = (*(uint32_t *)FUSES_ROOM_ADC_VAL_PTAT_ADDR & FUSES_ROOM_ADC_VAL_PTAT_Msk) >> FUSES_ROOM_ADC_VAL_PTAT_Pos;
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uint16_t VPH = (*(uint32_t *)FUSES_HOT_ADC_VAL_PTAT_ADDR & FUSES_HOT_ADC_VAL_PTAT_Msk) >> FUSES_HOT_ADC_VAL_PTAT_Pos;
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uint16_t VCL = (*(uint32_t *)FUSES_ROOM_ADC_VAL_CTAT_ADDR & FUSES_ROOM_ADC_VAL_CTAT_Msk) >> FUSES_ROOM_ADC_VAL_CTAT_Pos;
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uint16_t VCH = (*(uint32_t *)FUSES_HOT_ADC_VAL_CTAT_ADDR & FUSES_HOT_ADC_VAL_CTAT_Msk) >> FUSES_HOT_ADC_VAL_CTAT_Pos;
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// From SAMD51 datasheet: section 45.6.3.1 (page 1327).
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return (TL*VPH*TC - VPL*TH*TC - TL*VCH*TP + TH*VCL*TP) / (VCL*TP - VCH*TP - VPL*TC + VPH*TC);
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}
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#endif // SAMD51
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2017-08-31 13:48:30 -04:00
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float common_hal_mcu_processor_get_temperature(void) {
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2018-04-27 21:03:42 -04:00
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struct adc_sync_descriptor adc;
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static Adc* adc_insts[] = ADC_INSTS;
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samd_peripherals_adc_setup(&adc, adc_insts[0]);
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#ifdef SAMD21
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// The parameters chosen here are from the temperature example in:
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// http://www.atmel.com/images/Atmel-42645-ADC-Configurations-with-Examples_ApplicationNote_AT11481.pdf
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// That note also recommends in general:
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// "Discard the first conversion result whenever there is a change
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// in ADC configuration like voltage reference / ADC channel change."
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adc_sync_set_resolution(&adc, ADC_CTRLB_RESSEL_12BIT_Val);
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adc_sync_set_reference(&adc, ADC_REFCTRL_REFSEL_INT1V_Val);
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2019-10-12 15:42:15 -04:00
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// Channel arg is ignored.
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adc_sync_enable_channel(&adc, IGNORED_CHANNEL);
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2018-04-27 21:03:42 -04:00
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adc_sync_set_inputs(&adc,
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ADC_INPUTCTRL_MUXPOS_TEMP_Val, // pos_input
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ADC_INPUTCTRL_MUXNEG_GND_Val, // neg_input
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2019-10-12 15:42:15 -04:00
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IGNORED_CHANNEL); // channel (ignored)
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2018-04-27 21:03:42 -04:00
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hri_adc_write_CTRLB_PRESCALER_bf(adc.device.hw, ADC_CTRLB_PRESCALER_DIV32_Val);
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hri_adc_write_SAMPCTRL_SAMPLEN_bf(adc.device.hw, ADC_TEMP_SAMPLE_LENGTH);
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hri_sysctrl_set_VREF_TSEN_bit(SYSCTRL);
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// Oversample and decimate. A higher samplenum produces a more stable result.
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hri_adc_write_AVGCTRL_SAMPLENUM_bf(adc.device.hw, ADC_AVGCTRL_SAMPLENUM_4_Val);
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hri_adc_write_AVGCTRL_ADJRES_bf(adc.device.hw, 2);
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volatile uint16_t value;
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// Read twice and discard first result, as recommended in section 14 of
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// http://www.atmel.com/images/Atmel-42645-ADC-Configurations-with-Examples_ApplicationNote_AT11481.pdf
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// "Discard the first conversion result whenever there is a change in ADC configuration
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// like voltage reference / ADC channel change"
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// Empirical observation shows the first reading is quite different than subsequent ones.
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2019-10-12 15:42:15 -04:00
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// Channel arg is ignored.
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adc_sync_read_channel(&adc, IGNORED_CHANNEL, ((uint8_t*) &value), 2);
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adc_sync_read_channel(&adc, IGNORED_CHANNEL, ((uint8_t*) &value), 2);
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2018-04-27 21:03:42 -04:00
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adc_sync_deinit(&adc);
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return calculate_temperature(value);
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#endif // SAMD21
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#ifdef SAMD51
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adc_sync_set_resolution(&adc, ADC_CTRLB_RESSEL_12BIT_Val);
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2019-10-12 15:42:15 -04:00
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// Using INTVCC0 as the reference voltage.
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2018-04-27 21:03:42 -04:00
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// INTVCC1 seems to read a little high.
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2019-10-12 15:42:15 -04:00
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// INTREF doesn't work: ADC hangs BUSY. It's supposed to work, but does not.
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// The SAME54 example from Atmel START implicitly uses INTREF.
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2018-04-27 21:03:42 -04:00
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adc_sync_set_reference(&adc, ADC_REFCTRL_REFSEL_INTVCC0_Val);
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hri_supc_set_VREF_ONDEMAND_bit(SUPC);
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2019-10-12 15:42:15 -04:00
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// Enable temperature sensor.
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2018-04-27 21:03:42 -04:00
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hri_supc_set_VREF_TSEN_bit(SUPC);
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2019-10-12 15:42:15 -04:00
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hri_supc_set_VREF_VREFOE_bit(SUPC);
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2018-04-27 21:03:42 -04:00
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2019-10-12 15:42:15 -04:00
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// Channel arg is ignored.
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adc_sync_enable_channel(&adc, IGNORED_CHANNEL);
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2018-04-27 21:03:42 -04:00
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adc_sync_set_inputs(&adc,
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ADC_INPUTCTRL_MUXPOS_PTAT_Val, // pos_input
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ADC_INPUTCTRL_MUXNEG_GND_Val, // neg_input
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2019-10-12 15:42:15 -04:00
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IGNORED_CHANNEL); // channel (ignored)
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2018-04-27 21:03:42 -04:00
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// Read both temperature sensors.
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volatile uint16_t ptat;
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volatile uint16_t ctat;
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2019-10-12 15:42:15 -04:00
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// Read twice for stability (necessary?).
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adc_sync_read_channel(&adc, IGNORED_CHANNEL, ((uint8_t*) &ptat), 2);
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adc_sync_read_channel(&adc, IGNORED_CHANNEL, ((uint8_t*) &ptat), 2);
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2018-04-27 21:03:42 -04:00
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adc_sync_set_inputs(&adc,
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ADC_INPUTCTRL_MUXPOS_CTAT_Val, // pos_input
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ADC_INPUTCTRL_MUXNEG_GND_Val, // neg_input
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2019-10-12 15:42:15 -04:00
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IGNORED_CHANNEL); // channel (ignored)
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adc_sync_read_channel(&adc, IGNORED_CHANNEL, ((uint8_t*) &ctat), 2);
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adc_sync_read_channel(&adc, IGNORED_CHANNEL, ((uint8_t*) &ctat), 2);
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// Turn off temp sensor.
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hri_supc_clear_VREF_TSEN_bit(SUPC);
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2018-04-27 21:03:42 -04:00
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adc_sync_deinit(&adc);
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return calculate_temperature(ptat, ctat);
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#endif // SAMD51
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2017-08-31 13:48:30 -04:00
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}
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2019-10-12 15:42:15 -04:00
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float common_hal_mcu_processor_get_voltage(void) {
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struct adc_sync_descriptor adc;
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static Adc* adc_insts[] = ADC_INSTS;
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samd_peripherals_adc_setup(&adc, adc_insts[0]);
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#ifdef SAMD21
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adc_sync_set_reference(&adc, ADC_REFCTRL_REFSEL_INT1V_Val);
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#endif
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#ifdef SAMD51
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hri_supc_set_VREF_SEL_bf(SUPC, SUPC_VREF_SEL_1V0_Val);
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hri_supc_set_VREF_VREFOE_bit(SUPC);
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2020-06-19 15:05:51 -04:00
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|
2019-10-12 15:42:15 -04:00
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adc_sync_set_reference(&adc, ADC_REFCTRL_REFSEL_INTREF_Val);
|
2020-06-19 15:05:51 -04:00
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|
|
// On some processor samples, the ADC will hang trying to read the voltage. A simple
|
|
|
|
// delay after setting the SUPC bits seems to fix things. This appears to be due to VREFOE
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|
|
// startup time. There is no synchronization bit to check.
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|
|
// See https://community.atmel.com/forum/samd51-using-intref-adc-voltage-reference
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|
|
mp_hal_delay_ms(1);
|
2019-10-12 15:42:15 -04:00
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|
|
#endif
|
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|
|
adc_sync_set_resolution(&adc, ADC_CTRLB_RESSEL_12BIT_Val);
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|
|
// Channel arg is ignored.
|
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|
|
adc_sync_set_inputs(&adc,
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|
ADC_INPUTCTRL_MUXPOS_SCALEDIOVCC_Val, // IOVCC/4 (nominal 3.3V/4)
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|
ADC_INPUTCTRL_MUXNEG_GND_Val, // neg_input
|
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|
|
IGNORED_CHANNEL); // channel (ignored).
|
|
|
|
adc_sync_enable_channel(&adc, IGNORED_CHANNEL);
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|
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|
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|
|
volatile uint16_t reading;
|
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|
|
|
|
|
|
// Channel arg is ignored.
|
|
|
|
// Read twice and discard first result, as recommended in section 14 of
|
|
|
|
// http://www.atmel.com/images/Atmel-42645-ADC-Configurations-with-Examples_ApplicationNote_AT11481.pdf
|
|
|
|
// "Discard the first conversion result whenever there is a change in ADC configuration
|
|
|
|
// like voltage reference / ADC channel change"
|
|
|
|
// Empirical observation shows the first reading is quite different than subsequent ones.
|
|
|
|
adc_sync_read_channel(&adc, IGNORED_CHANNEL, ((uint8_t*) &reading), 2);
|
|
|
|
adc_sync_read_channel(&adc, IGNORED_CHANNEL, ((uint8_t*) &reading), 2);
|
|
|
|
|
|
|
|
adc_sync_deinit(&adc);
|
|
|
|
// Multiply by 4 to compensate for SCALEDIOVCC division by 4.
|
|
|
|
return (reading / 4095.0f) * 4.0f;
|
|
|
|
}
|
2017-08-31 13:48:30 -04:00
|
|
|
|
|
|
|
uint32_t common_hal_mcu_processor_get_frequency(void) {
|
2017-09-29 16:58:13 -04:00
|
|
|
// TODO(tannewt): Determine this dynamically.
|
|
|
|
return CONF_CPU_FREQUENCY;
|
2017-08-31 13:48:30 -04:00
|
|
|
}
|
2018-01-18 14:39:11 -05:00
|
|
|
|
|
|
|
void common_hal_mcu_processor_get_uid(uint8_t raw_id[]) {
|
|
|
|
#ifdef SAMD21
|
|
|
|
uint32_t* id_addresses[4] = {(uint32_t *) 0x0080A00C, (uint32_t *) 0x0080A040,
|
|
|
|
(uint32_t *) 0x0080A044, (uint32_t *) 0x0080A048};
|
|
|
|
#endif
|
|
|
|
#ifdef SAMD51
|
|
|
|
uint32_t* id_addresses[4] = {(uint32_t *) 0x008061FC, (uint32_t *) 0x00806010,
|
|
|
|
(uint32_t *) 0x00806014, (uint32_t *) 0x00806018};
|
|
|
|
#endif
|
|
|
|
|
|
|
|
for (int i=0; i<4; i++) {
|
|
|
|
for (int k=0; k<4; k++) {
|
2018-03-25 13:57:43 -04:00
|
|
|
raw_id[4 * i + k] = (*(id_addresses[i]) >> k * 8) & 0xff;
|
2018-01-18 14:39:11 -05:00
|
|
|
}
|
|
|
|
}
|
|
|
|
}
|